Scanning Probe Microscope

With the new JSPM-5200 from Jeol physical properties of specimens can be observed in their native environments. It allows to examine cooled or heated samples in fluid, controlled air, ambient air, or vacuum. JSPM-5200 combines high resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) in one instrument. JSPM-5200 can be configured for a wide variety of analysis functions. Furthermore it has been designed for easy use under all experimental and observational conditions.