Saving time with a four times higher scan speed, Olympus’ new confocal microscope improves efficiency in industrial inspection. The LEXT OLS5000 combines 4K scanning and a large working distance with intuitive software to capture the shape of any sample under any angle. The LEXT OLS5000 helps users reach the next level of metrology. With dedicated objectives, an improved scanning algorithm and a 210 mm extension frame, the new LEXT can accommodate and measure a larger range of samples – as well as saving time and improving productivity.
Acquiring highly accurate data in less time, the OLS5000 microscope incorporates a PEAK algorithm for 3D data construction. This algorithm, combined with the intelligent Skip Scan function, has reduced data acquisition times by 75%. These time savings make the new OLS5000 well suited for high throughput applications, such as quality control in the automotive, electronic component and semiconductor industries.