03/01/2017 • Analytics • Laboratory appliances

D8 Advance Plus X-Ray Diffraction (XRD) solution

X-Ray Diffraction

Bruker AXS introduces the D8 Advance Plus X-Ray Diffraction (XRD) solution.

It is designed to investigate epitaxial and polycrystalline thin films, large and oddly shaped bulk specimens, as well as microto macro-amounts of powder samples under ambient and non-ambient conditions. The Trio optic is combining the three most commonly used X-ray diffraction geometries in one single optic: divergent beam for X-Ray Powder Diffraction (XRPD); high intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry, coating thickness determination and micro-diffraction; and pure Cu-Ká1 parallel beam for High-Resolution XRay Diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples.

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