05/30/2016 • Image processing / Optical metrology

TopMap Pro.Surf

White Light Interferometer with Integrated Multi-Sensor Concept

The TopMap Pro.Surf from Polytec is a white light interferometer especially designed for large area measurement. Single measurement volume (without stitching) of 30 x 40 x 70 mm3 can be acquired with a vertical resolution in nanometer range and with a high lateral resolution. For the applications in which an even higher lateral resolution is required (e.g. an additional measurement to evaluate roughness), a multi-sensor concept integrated with chromatic confocal probing is available.

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Polytec GmbH

Polytec-Platz 1-7
76337 Waldbronn

Phone: +49 (0) 7243/ 604- 0
Fax: +49 (0) 7243/ 69944

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