The new ELiiXA+ 8k/4k camera is designed specifically to provide advanced speed up to 100.000 lines/s, supreme sensitivity and high resolution by incorporating an innovative CMOS pixel architecture, combining the most advanced signal to noise ratio per individual pixel, and multi-line architecture to boost sensitivity further by sequentially integrating the same object line with full exposure control.
The new camera with camera link interface brings high performance sensor technology to a broader range of applications, such as the inspection of raw material surfaces and general web material, the sorting of parcel and postal documents, the scanning of print and high resolution documents as well as the advanced inspection of flat panel displays, printed circuit boards and solar cells.
The camera provides the following features - the two most desired resolutions available in the same camera for versatile integration and evolution: 8192 pixels, 5µm x 5µm pixel pitch, 4 active CMOS lines and 4096 pixels, 10µm x 10 µm pixel pitch, 2 active CMOS lines.
e2v’s ELiiXA+ 8k/4k camera also benefits from a compact design with a 41mm active sensor that can be operated in an 8k or 4k pixel mode depending on the user settings. The camera is cost effective to implement as the sensor length is compatible with the readily available and affordable F-mount lenses which perfectly matches the 5µm pixel size. Two models of the new camera are available with either Medium Camera Link interface or Full/Deca Camera Link interface.
This new camera competes directly with single/dual line scan camera technology and CCD TDI solutions, but the ELiiXA+ cameras have the advantage of delivering higher product performance with fewer integration constraints.
The e2v R&D team has worked hard to develop multi-line CMOS technology so that it achieves 100,000 lines/sec but still delivers high sensitivity. This is done by using the sensors 4 active lines whilst at the same time keeping the power consumption below 7W and giving the user full control over the exposure time.