Autofocus System

Continuous Reflective Interface Sample Placement (Crisp) substantially eliminates focus drift in high power microscopy by sensing minute changes between the objective lens and the specimen’s cover slip, and then providing a feedback signal to any of ASI’s focus controllers, or existing piezo focusing devices. The Crisp system provides high-level focus stability allowing a specimen to remain accurately focused for hours at a time with a focus accuracy of 5% of the objective depth of focus, and will also maintain focus while scanning. The Crisp module adapts to the C-mount port of nearly all microscopes with a DCMS beam splitter.