Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. The detector is provided in different designs and with various active areas starting from 10 mm2 up to 100 mm2, to ensure optimal conditions for any application at any type of electron microscope.

Due to the Slim-line design, all detectors of the XFlash 6 family provide the largest possible solid angle per active area for maximum collection efficiency, which is especially important at low electron beam currents. Combined with the hybrid pulse processing technology, XFlash 6 detectors can accept input count rates in excess of 1,500 kcps with throughput as high as 600 kcps, and maintain their best energy resolution over the widest range of count rates.