QUANTAX EDS Analysis System

Bruker AXS Microanalysis presents the QUANTAX EDS analysis system using the unique XFlash Silicon Drift Detectors and the powerful ESPRIT analysis software. The new XFlash 5000 Detector family currently consists of three members: The 10 mm² detector XFlash 5010 is ideally suited for analysis in the low energy range with the best possible energy resolution of 123 eV at Mn-Ka and 100,000 cps. The 30 mm² XFlash 5030 – with its large active area – offers optimum detection efficiency for low beam current applications. The four-channel XFlash QUAD 5040, with its four 10 mm² sensors integrated on a single detector chip, provides optimum performance at all count rates, accepting up to 3,000,000 cps input count rate and yet delivering 123 eV energy resolution at Mn-Ka and 100,000 cps.

QUANTAX provides ultimate productivity in EDS analysis. The genuinely standardless P/B-ZAF algorithm permits reliable quantitative analysis of even the most difficult samples, like rough surfaces or particles. The excellent low energy performance with energy resolutions of 43 eV at C-Ka and 53 eV at F-Ka, for our best detectors, makes previously undetectable element peaks visible, accurate identification therefore requires a comprehensive atomic database to avoid misidentification. The ESPRIT analysis software’s database provides the full range of K, L and M lines with correct energies and relative intensities. Previously time-consuming applications like large scale mapping and HyperMap (position-tagged spectrometry) are now performed at tenfold speed compared to classical Si(Li) detectors in case of the XFlash 4010, the XFlash QUAD can speed up the same analyses fiftyfold.