03/17/2008 • Microscopy / Imaging

Electromechanical Measurements at the Nanoscale

Asylum Research has developed its new Piezo Force Module which allows advanced enables very high sensitivity, high bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. It is exclusively available for the MFP-3D Atomic Force Microscope. Electromechanical coupling is one of the fundamental natural mechanisms underlying the functionality of many inorganic and macromolecular materials and is ubiquitous in biological systems. The emergence of ferroelectric and multiferroic non-volatile memories and data storage devices have stimulated the studies of electromechanically active materials at the nanoscale. In the last decade, piezoresponse force microscopy (PFM) has emerged as the preeminent tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric materials.
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Asylum Research

6310 Hollister Ave.
CA 93117 Santa Barbara

Phone: +1 (0) 805/ 696- 6467
Fax: +1 (0) 805/ 696- 6444