06/18/2007 • Microscopy / Imaging

ULTRA 55 Special Edition Nanostructural Analysis Tool

The ULTRA 55 special edition is an analysis tool to meet ultra highest demands for nanostructural applications. The ULTRA 55 special edition provides highest analytical capabilities combined with economic value and ease of use for the customer. The ULTRA 55 special edition comprises the Basic ULTRA 55 plus the following new options:

40nA beam current for highest analytical demands

100 μm beam shift for most precise and flexible shift of field of view at highest magnification

Economic quiet mode for comfortable and cost saving operation

User align of detectors for more ease of use when switching between different detectors.

Laser Finder for quick and easy sample navigation

The ULTRA 55 FESEM with GEMINI® technology comprises three column integrated electron detection systems: In-lens SE, In-column EsB and AsB together with the chamber mounted Everhart Thornley Detector. Combined with the large multi-port analytical chamber and the fully motorized 5-axes eucentric stage, the ULTRA 55 offers superb analytical capabilities.

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Carl Zeiss SMT

Carl-Zeiss-Str. 56
73447 Oberkochen

Phone: +49 (0) 7364/203836
Fax: +49 (0) 7364/204343