Digital Diffraction Pattern Analysis

The Item Diffraction extension from Soft Imaging System makes it possible to automatically index, evaluate, measure and analyse diffraction patterns. As with all other extensions, it is fully integrated with Item, the company's transmission electron microscopy image analysis platform. The base-level version offers numerous functions for processing, analysis, visualization and archiving of images and other data as well as for automation and report generation. With its solution-oriented software extensions, its range of functions can be precisely expanded according to the user's needs.

	This product information was first published in G.I.T. Imaging & Microscopy 3/2005.