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5th Generation SPM Technology
The Dimension V SPM for a broad range of research and industrial applications features Veeco’s next generation high-speed, state of the art controller, the Nanoscope V, enabling researchers to see faster molecular scale events, capture more information in every image and work with “one-button” simplicity. Veeco’s new Easy-AFM, a key feature of the system, offers an intuitive, easy-to-follow graphic interface for new or infrequent SPM users. The Dimension V is primarily used for larger samples such as semiconductor wafers, data storage films and electrical characterisation applications. The product now features industry-leading high-speed data capture (50 MHz), increased thermal tune capabilities and high pixel density images which allow observation of large structures and small features in the same image. The Nanoscope V controller captures up to eight images simultaneously. The Dimension V uses NanoScript open-architecture, compatible with all of the common programming languages currently used in scientific labs worldwide.
| This product information was first published in Inspect 3/2006. |
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